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Afm Weekender Tote Bag featuring the photograph Atomic Force Microscopy Cantilever by Meckes/ottawa

Boundary: Bleed area may not be visible.

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Atomic Force Microscopy Cantilever Weekender Tote Bag

Meckes/ottawa

by Meckes/ottawa

$48.00

Size

Rope Color

Image Size

 
 

Product Details

Our weekender tote bags are chic and perfect for a day out on the town, a staycation, or a weekend getaway.   The tote is crafted with soft, spun poly-poplin fabric and features double-stitched seams for added durability.   The 1" thick cotton handles are perfect for carrying the bag by hand or over your shoulder.   This is a must-have for the summer.

Design Details

Atomic force microscopy. Color enhanced scanning electron micrograph (SEM) of a cantilever and tip (triangle), as used in atomic force microscopy... more

Care Instructions

Spot clean or dry clean only.

Ships Within

2 - 3 business days

Additional Products

Atomic Force Microscopy Cantilever Photograph by Meckes/ottawa

Photograph

Atomic Force Microscopy Cantilever Canvas Print

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Atomic Force Microscopy Cantilever Framed Print

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Atomic Force Microscopy Cantilever Poster

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Atomic Force Microscopy Cantilever Metal Print

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Atomic Force Microscopy Cantilever Wood Print

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Atomic Force Microscopy Cantilever Weekender Tote Bag

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Atomic Force Microscopy Cantilever Sticker

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Atomic Force Microscopy Cantilever Ornament

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Weekender Tote Bag Tags

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Photograph Tags

photographs tool photos colorized photos micro photos micrograph photos science photos sem photos technique photos technology photos triangle photos

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Artist's Description

Atomic force microscopy. Color enhanced scanning electron micrograph (SEM) of a cantilever and tip (triangle), as used in atomic force microscopy (AFM). An atomic force microscope is used to study surfaces at an atomic level. It can also be used to test the hardness of a very small volume of material, by pressing the tip into the material to a known maximum load. Magnification x6600 when printed at 10 centimeters wide.

 

$48.00