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Afm Weekender Tote Bag featuring the photograph Atomic Force Microscopy Cantilever Sem by Meckes/ottawa

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Atomic Force Microscopy Cantilever Sem Weekender Tote Bag

Meckes/ottawa

by Meckes/ottawa

$48.00

Size

Rope Color

Image Size

 
 

Product Details

Our weekender tote bags are chic and perfect for a day out on the town, a staycation, or a weekend getaway.   The tote is crafted with soft, spun poly-poplin fabric and features double-stitched seams for added durability.   The 1" thick cotton handles are perfect for carrying the bag by hand or over your shoulder.   This is a must-have for the summer.

Design Details

Atomic force microscopy. Color enhanced scanning electron micrograph (SEM) of a cantilever used in atomic force microscopy (AFM). An atomic force... more

Care Instructions

Spot clean or dry clean only.

Ships Within

2 - 3 business days

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Atomic Force Microscopy Cantilever Sem Photograph by Meckes/ottawa

Photograph

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Weekender Tote Bag Tags

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Photograph Tags

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Artist's Description

Atomic force microscopy. Color enhanced scanning electron micrograph (SEM) of a cantilever used in atomic force microscopy (AFM). An atomic force microscope is used to study surfaces at an atomic level. It can also be used to test the hardness of a very small volume of material, by pressing the tip into the material to a known maximum load. Magnification x200 when printed at 10 centimeters wide.

 

$48.00