Atomic Force Microscopy Cantilever #1
by Meckes/ottawa
Title
Atomic Force Microscopy Cantilever #1
Artist
Meckes/ottawa
Medium
Photograph - Photograph
Description
Atomic force microscopy. Color enhanced scanning electron micrograph (SEM) of a cantilever and tip (triangle), as used in atomic force microscopy (AFM). An atomic force microscope is used to study surfaces at an atomic level. It can also be used to test the hardness of a very small volume of material, by pressing the tip into the material to a known maximum load. Magnification x2000 when printed at 10 centimeters wide.
Uploaded
May 19th, 2021
Embed
Share
Comments
There are no comments for Atomic Force Microscopy Cantilever #1. Click here to post the first comment.