Atomic Force Microscopy Cantilevers
by Meckes/ottawa
Title
Atomic Force Microscopy Cantilevers
Artist
Meckes/ottawa
Medium
Photograph - Photograph
Description
Atomic force microscopy. Color enhanced scanning electron micrograph (SEM) of cantilevers and tips (triangles), as used in atomic force microscopy (AFM). An atomic force microscope is used to study surfaces at an atomic level. It can also be used to test the hardness of a very small volume of material, by pressing the tip into the material to a known maximum load. Magnification x500 when printed at 10 centimeters wide.
Uploaded
May 19th, 2021
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